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On the low temperature resistivity measurement of CdSe thin film

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On the low temperature resistivity measurement of CdSe thin film

R.K.Shah | H.O.Parmar | H.S.Patel

R.K.Shah | H.O.Parmar | H.S.Patel "On the low temperature resistivity measurement of CdSe thin film" Published in International Journal of Trend in Scientific Research and Development (ijtsrd), ISSN: 2456-6470, Volume-1 | Issue-2 , February 2017, URL: http://www.ijtsrd.com/papers/ijtsrd65.pdf

Most group II-VI compounds are direct band gap semiconductors with high optical absorption and emission coefficients .Cadmium Selenide is a leading candidate with high potential towards many applications. The authors present their investigations dealing with preparation and some electrical characterization of the CdSe thin films. The films were deposited onto a well-cleaned glass substrates using thermal evaporation technique. The dependence of electrical resistivity of CdSe thin film in low temperature range has been studied.

Cadmium Selenide, thermal evaporation technique, thin film, electrical resistivity


Volume-1 | Issue-2 , February 2017

2456-6470

IJTSRD65